Page 11 - Advanced Handling Systems

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11
Separation and inspection
The challenge
Separate and visually examine
wafers at high speed without
damage.
Solution
H-gantry for separation and
Compact Vision System SBO..-Q
for inspection.
Inspection and stacking
The challenge
Unload, stack, test and sort
wafers gently with optimised
cycle times.
Solution
Inspection with Compact Vision
System SBO..-Q, stacking in
blister boxes with H-gantry and
rotary lifting module. Suitable
for up to 5000 wafers per hour
depending on the configuration.
Intersolar Award 2010
Installation space comparison
System functions
1
The gripper system is
positioned exactly above
the magazine
2
The Bernoulli gripper
removes the wafer from the
magazine without virtually
any contact
3
The wafer is positioned
and inspected by the intelligent
Compact Vision System:
• Exact position control
• Quality of the contour and
edges
4
The rotary lifting module
rotates and positions the
wafer precisely in line with
the appropriate track
5
The wafer is placed on the
conveyor in a defined sequence
6 Complete, highly dynamic
position control via robotic
controller CMXR
Working space of H-gantry
Working space of 2 SCARA
In solar module production
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